光学

应用介绍

Optical spectroscopic techniques, such as UV-VIS-NIR and Raman, allow for the at-line and in-line, real-time analysis of multiple parameters for process and quality control. The spectrometer systems have been used for reflection measurements in various applications and are easily adapted to different sampling methods including fiber-optic reflection probes and active measuring heads. The sample is illuminated by a continuous, white light source. The reflected light is then measured, allowing the determination of the spectral information as a function of wavelength.

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Thin film Measurement of Anti-Reflection Coatings on Solar Cells

The modern diode-array technology provides a fast and effective in-line measure of the reflectance and the color of the anti-reflection coating on solar cells. This information enables process optimization and color sorting. Furthermore, with the index of refraction, the software can precisely calculate the layer thickness. This application was created in a joint venture with Vitronic and won the CellAward in 2009.